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匿名使用者 發問時間: 社會與文化語言 · 1 0 年前









現在我們的措施是將金屬層的材質由 "C" 改為 "D"來作樣品給您測試。





註: 流離(spread)


容質(the value of cap.)

2 個解答

  • 1 0 年前

    Dear customer,

    Based on your description, our engineers have the following explanations.

    (1) Under your test environment, B has lower defective rate than A. The thicker metal layer(membrane) in B is the key. When a high amp current passes through the thicker metal layer(membrane), the rate of spread gets slower. So the value of cap. declines at a moderate rate. However, this phenomenon is not sustainable. After a while, the value off cap. still converges to zero.

    A is designed to survive under 3 kV voltage surge, as a result, it has thinner metal layer ( membrane). That is why the high amp current will cause the higher rate of spread. In turns, the value of cap. decays at a relative significant rate. This point can be proven by examining the "defective" samples you returned. Obviously, the middle of metal layer(membrane) disappears and the residues pile toward left and right side. Our solution is to substitute the material of the metal layer(membrane). Instead of C, D is applied to form the metal layer(membrane). You conduct the sequential test to the samples made by D.

    (2)Because of the limited space, it is extremely difficult to put film inside the box, needless to say the epoxy. Since epoxy insulates water and external contact, it can prevent "short circuits" or "high-voltage puncture."(high-pressure puncture). If there were any gap (leak) in samples, the defective samples would have been filtered out before passing the high-voltage test.(high-pressure test). You don't have to worry about this issue at all.

    2006-11-07 04:05:14 補充:

    You can conduct the sequential test to the samples made by D. 才對

    參考資料: 國立編譯館 大學物理英文手冊
  • 6 年前