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匿名使用者
匿名使用者 發問時間: 社會與文化語言 · 1 0 年前

中翻英...急件!(20點)..請勿用翻譯軟體直翻!感謝!

針對近日您的敘述,我司工程師作以下說明及措施:

(1)

在您測試的環境下,B會比A的不良率較低。

那是因為B的金屬層較厚,所以遭遇到大電流時,金屬層上的流離較慢。

所以容值衰減短期內較少,但時間拉長後一樣會接近於零。

A為了可耐3KV以上surge,所以金屬層較薄,導致大電流時,金屬流離兩側較快,

而造成容值衰減較顯著,這由您寄回的不良品可證實,中間空白,金屬層往兩邊擴散。

現在我們的措施是將金屬層的材質由 "C" 改為 "D"來作樣品給您測試。

(2)

因為小型化的關係,film要塞進box裡有很大困難,更何況是epoxy。

epoxy主要是杜絕外界接觸及防水,以免高壓直接擊穿與電直接短路。

有空隙的話在我司高壓測試時就會被擊穿篩選下來,請您放心!

註: 流離(spread)

擊穿(puncture)

容質(the value of cap.)

2 個解答

評分
  • 1 0 年前
    最佳解答

    Dear customer,

    Based on your description, our engineers have the following explanations.

    (1) Under your test environment, B has lower defective rate than A. The thicker metal layer(membrane) in B is the key. When a high amp current passes through the thicker metal layer(membrane), the rate of spread gets slower. So the value of cap. declines at a moderate rate. However, this phenomenon is not sustainable. After a while, the value off cap. still converges to zero.

    A is designed to survive under 3 kV voltage surge, as a result, it has thinner metal layer ( membrane). That is why the high amp current will cause the higher rate of spread. In turns, the value of cap. decays at a relative significant rate. This point can be proven by examining the "defective" samples you returned. Obviously, the middle of metal layer(membrane) disappears and the residues pile toward left and right side. Our solution is to substitute the material of the metal layer(membrane). Instead of C, D is applied to form the metal layer(membrane). You conduct the sequential test to the samples made by D.

    (2)Because of the limited space, it is extremely difficult to put film inside the box, needless to say the epoxy. Since epoxy insulates water and external contact, it can prevent "short circuits" or "high-voltage puncture."(high-pressure puncture). If there were any gap (leak) in samples, the defective samples would have been filtered out before passing the high-voltage test.(high-pressure test). You don't have to worry about this issue at all.

    2006-11-07 04:05:14 補充:

    You can conduct the sequential test to the samples made by D. 才對

    參考資料: 國立編譯館 大學物理英文手冊
  • 6 年前

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